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(parent: 272c903) | patch
Update sdt_misc.exp testcase for ARM
authorWade Farnsworth <wade_farnsworth@mentor.com>
Wed, 28 Mar 2012 14:47:06 +0000 (07:47 -0700)
committerFrank Ch. Eigler <fche@redhat.com>
Wed, 28 Mar 2012 15:41:33 +0000 (11:41 -0400)
commit49e7723ec3d2ba8dcd120f5583e142e88f51f7ec
treede38264d703d6386fa072dad310143ee75e7097btree
parent272c9036cb73f3763e3a8a550a48ac59799fcbe6commit | diff
Update sdt_misc.exp testcase for ARM

* Omit -m64 switch for wildcard tests, as ARM does not implement this
switch
* Mark a subset of the V1 and V2 tests as XFAIL, as they are known to fail
due to broken operand parsing on ARM.  Note that this brokenness does
not affect V3.

Signed-off-by: Wade Farnsworth <wade_farnsworth@mentor.com>
testsuite/systemtap.base/sdt_misc.exp diff | blob | blame | history
systemtap: system-wide probe/trace tool
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